HRE series

HRE series EMC High-resolution Scanners with 3D or 4D scanning

Ultra-high-resolution scanning

The HRE series comes in two different sizes to fit most DUTs and combine ultra-high scan resolution of 25 μm with probe head rotation, and the best-in-class scanning SW to deliver powerful visualization of the EMC test. An optional IC scan kit, with dedicated inspection camera and high resolution near-field probes, lets you even scan for emission and immunity hotspots inside an IC.

How do you perform EMC-scanning?

A complete scanner system consists of the EMC-Scanner Hardware package, the Detectus Scanning SW (DSS), a Spectrum Analyzer and a PC to run the scanner SW. Pendulum Instruments can supply everything if required, but normally the user already possesses a PC and a Spectrum Analyzer.

The test object is put on the coordinate board and a small near-field probe is moved in a controlled and repeatable path above the test object, registering the field strength. The probe output signal in every position is measured by the Spectrum Analyzer, and transferred to the scanner SW. The smart SW combines the spatial information (X,Y,Z) with the spectrum in that position, and presents detailed results.

Leading Performance from the Detectus designers

With 25 μm step size of the scanner, you can pinpoint emission sources in densely packed designs. You can even follow emission hot spots inside an IC, using the IC option

You can scan emissions up to 10 GHz, with the standard Pendulum Probe kits. If the user has near-field probes going up to higher frequencies, e.g. 70 GHz, these can normally be attached and used for EMC-scanning. The SW has no limits, but you must of course use a Spectrum Analyzer that support the frequency range.

Within the Detectus HRE series you can choose if you want to measure, with or without probe rotation. The scan area (WxDxH) is:

390x290x130 mm (3D or 4D*)

* 4D = 3D xyz movement, plus probe rotation 0 to 360^o

Advantages of the Detectus HRE scanner

In R&D

Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.

If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.

Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.

You can compare different design solutions and make comparative measurements of electromagnetic emissions. You can even analyze the EMI-noise inside an IC or a compact module, thanks to the ultra-high-resolution step size (25 μm)

In Q&A

The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.

World class SW lets you SEE electromagnetic fields

The easy-to-use and feature-rich DSS SW let you measure and visualize the intensity and the location of a radiation source at a component level – or even inside a component. The results of such a measurement can be shown as two- or three-dimensional colored maps. The measurements can easily be repeated creating objective, comparative measurement results.

Measurements can be saved and later compared with board-level changes, thanks to the exact repetitive scanning. The SW even allows to subtract two scanning results to emphasize the true difference of any board layout – or component – change.